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Aehr Test Systems Receives Order for Its Advanced Burn-In and Test System (ABTS(TM))

/ Source: GlobeNewswire

FREMONT, Calif., Nov. 16, 2010 (GLOBE NEWSWIRE) -- Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an order for its new Advanced Burn-in and Test System (ABTS) from a leading U.S. military and aerospace customer. The system is configured for production burn-in and test of high pin-count logic devices.

"With ABTS systems sold to customers in the U.S., Europe, Japan, China, and Taiwan, this new order demonstrates the success of this highly modular and flexible platform in meeting our customers' diverse burn-in and test requirements around the globe," said Greg Perkins, vice president of worldwide sales and service at Aehr Test Systems. "This production configuration of the ABTS system was chosen for its high 72 burn-in board capacity and its ability to burn-in and test future higher pin-count ASIC and custom logic devices."

The ABTS family of products is based on a new hardware and software architecture that is designed to address not only today's devices, but also future devices for many years to come. The ABTS family can test and burn-in memory devices as well as both high and low-power logic devices. The ABTS system can be configured to provide individual device temperature control for devices up to 75W or more and with up to 320 I/O channels. The system uses N+1 redundancy technology for many key components in the system to provide the highest possible system uptime.

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative products, including the ABTS, FOXTM, MTX and MAX systems and the DiePak® carrier. The FOX system is a full wafer contact test and burn-in system. The MTX system is a massively parallel test system designed to reduce the cost of memory testing by performing both test and burn-in on thousands of devices simultaneously. The MAX system can effectively burn-in and functionally test complex devices, such as digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of bare die. For more information, please visit the Company's website at .

Safe Harbor Statement

This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding customer demand and acceptance of Aehr Test's products. Actual results may vary from projected results. These risks and uncertainties include, without limitation, acceptance by customers of the ABTS technology, acceptance by customers of the ABTS systems shipped upon receipt of a purchase order and the ability of new products to meet customer needs or perform as described. See Aehr Test's recent 10-K, 10-Q and other reports from time to time filed with the Securities and Exchange Commission (SEC) for a more detailed description of the risks facing our business. The Company disclaims any obligation to update information contained in any forward-looking statement to reflect events or circumstances occurring after the date of this press release.

CONTACT: Aehr Test Systems Greg Perkins, V.P. Worldwide Sales & Service (510) 623-9400 x241 Financial Relations Board Analyst/Investor Contact Lasse Glassen (213) 486-6546